Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Fingernail Test Probe
CX-Z11
Shenzhen Chuangxin Instruments Co., Ltd.
The Fingernail Test Probe is used to test to IEC 60335 and UL standards. It checks the security of parts that snap together. The spring loading in the handle can be calibrated to the force necessary to use the instrument. This probe is made of stainless steel with specially hardened tip and a Delrin?handle. Handle has a threaded hole for use with force gauges.
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Current Transformer Test Set
Vanguard Instruments Company, Inc.
The EZCT-2000C is Vanguard’s third-generation microprocessor-based current transformer test set. Designed specifically for CT testing, the EZCT-2000C has the following outstanding features that can greatly increase productivity and save time during the commissioning stage:
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Rotor Balancing System
For the purpose of rotating parts balancing in manufacturing scale, it is necessary to conduct measurements with the minimum possible participation of the operator. The Rotor balancing system is intended for measurements related to rotating parts balancing in automated mode.
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Embedded System Supporting MXM Graphics Module with 8th/9th Generation Intel® Core™ i7/i5/i3 in LGA1151 Socket
DLAP-3100-CF Series
- ADLINK MXM Graphics module support (Type A/B, up to 120W)- 8th/9th Gen Intel® Core™ i7/i5/i3, Celeron® processor- Dual SODIMMs for up to 64GB DDR4 non-ECC memory (dependent on CPU)- DisplayPort (2 from CPU, 4 from MXM)- 1x M.2 E key supporting 1630 or 2230 for Wi-Fi/Bluetooth module, 1x M.2 B key supporting 2242 or 2280 for SATA storage module 1x M.2 M key supporting 2242 or 2280 for SATA/PCIe x4 storage module- Reliable Molex type 12V DC-in connector- 1x Intel® i219-LM) and 5x Intel® i210-AT
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VNA Microwave/RF Cable Test Assemblies
VNA Microwave/RF Test Assemblies set the industry standard for vector network analyzers (VNAs) through 70 GHz. Constant and/or highly repetitive movement of cables can compromise the measurement precision of high-performance VNAs. Leading manufacturers choose GORE® VNA Microwave/RF Test Assemblies because of the improved performance they see in their equipment.
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UI Test Tool for Web, Java, Windows, Android & iOS
QF-Test
QF-Test is the established tool for professional GUI test automation of desktop, web & mobile applications as well as PDF documents. QF-Test is a low-code GUI test tool that allows you to efficiently create test cases, e.g. using Capture/Replay, without any programming knowledge across platforms on Windows, Linux and macOS. For software developers, Jython, Groovy or JavaScript offer advanced scripting possibilities. Tests can be run automatically via continuous integration tools such as Jen...show more -
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Fully-automatic Micro Hardness IRHD System
With high precision digital technology and servomotor technology employed, the Micro IRHD System has been designed on the concept of better operability and quality eligible for cutting-edge labs.
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Autoranging System DC Power Supply, 80 V, 340 A, 10000 W, 208 VAC
N8925A
The Keysight N8900 Series provides 5 kW, 10 kW, and 15 kW autoranging, single-output programmable DC power for ATE applications that require just the right amount of performance at just the right price. The N8900 Series power supplies' autoranging output characteristic enables unprecedented flexibility by offering a wide range of voltage and current combinations at full power. Power supplies with "rectangular," or traditional, output characteristics provide full power at only one voltage and current combination. Just one N8900 does the job of multiple power supplies. It's like having many power supplies in one!
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Voltage test
Yuyao City Yinte Neon-Electroscope Factory
voltage tester or detector is an electrical tester that helps to detect the presence of voltage. Voltage presence is useful information to have when troubleshooting or working on a failed asset. The first tool you'll reach for is a non-contact voltage detector.
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Boundary-Scan Test / In-System Programming Controller
CPXI-1149.1/Turbo
The CPXI-1149.1/Turbo is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the CPXI-1149.1/Turbo offers up to 80 MHz clock rates on 4, 8, or 32 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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Video Management System Ancillary Products
Curtiss-Wright Defense Solutions
To complement our range of displays, video recorders and video distribution units, Curtiss-Wright Defense Solutions offers ancillary products that can bring additional capabilities to a video management system.
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Radar Altimeter Test Set
Core Technology
Eastern OptX core technology enables the conversion of microwave signals to optical signals (E/O), time delaying this signal then reconverting the light back to original microwave signal (O/E) with superior fidelity over traditional time delay methods. Products include Radar Target Simulation, Radar Altimeter Testing, Channel Simulation (Air Interface) and Multipath Creation.
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Digital Audio Snake System
OmniSnake
The OmniSnake consists of a Stage Box that converts microphone/line-level analog inputs to a multiplexed digital signal, and a companion Base Unit that de-multiplexes to provide individual outputs. Digitizing the analog audio at the source eliminates the potential for ground loops, noise interference and crosstalk. Each Stage Box has 8 inputs, and two Stage Boxes can be linked together via coax to form a combined 16 channels, which is carried over coaxial cable to the Base Unit.
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Single Ended Test Probes
Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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Air Data Test Sets
For calibrating altimeters, airspeed indicators, rate-of-climbindicators and other avionic instruments.
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Modular TDM / IP Split Mount Radio System
CFIP PhoeniX M
CFIP PhoeniX M split mount system consists of PhoeniX M IDU and PhoeniX ODU (XPIC functionality supported). PhoeniX M IDU provides up to 63E1 and 2xSTM-1 bringing the total maximum capacity to 348 Mbps full duplex.
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Stand-Alone Test Fixture
MA 2013/D/H
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Level Test Set
ET 91
100 Hz to 2.4 MHz selective/wideband Level Meter & Generator,with Spectrum Analyser and Z/RL/LCL Bridge
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USB Type A Test Connector
Test connector for USB 2.0 Type A (4 pole) for contacting USB interfaces. Application in USB devices like hard disks, data carriers, power supplies, etc.
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PCI Express, PCI, Multi-Interface Test Backplanes
Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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A Highly Versatile R&D Bell Jar Thin Film Coating System.
MODEL VES-3000
TEK-VAC's VES-3000 coater station model offers a modular concept for thin film deposition. Common PVD techniques which can be employed in this compact unit include thermal and electron beam evaporation. A 2KVA SCR controlled filament evaporation power supply is provided. Optional ion deposition and magnetron sputtering devices can be incorporated in the system.
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Test Module
MTC
The measuring channels can be connected depending on the application to the pins on the system interface or to the six internal bus lines.Four measuring channels per module on 8:1 multiplexer = 32 InputsUp to 4 parallel measurements per MTC (4 parallel counters)Intelligent algorithms for fast measurements even at low frequenciesFrequency, period, pulse width, rise- and falling time as well as event counting on each channelTime measuring range: 10 ns - 42 s, resolution 10 nsFrequency measuring range: 0.015 - 100 MHzEvent counting: 0 - 232, maximum 100 MHzMax. input level/trigger voltage: +/-100 VSynchronization with external trigger possible
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PWB Interconnect Stress Test
PWB Interconnect Solutions Inc.
Services to test the reliability of Printed Circuit Boards. PCBs).Coupon Inspection and Electrical Prescreen. Coupon Testing. Failure Location via I/R Photo Imagery. Failure Analysis.
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Modular Breakout System 160-Pin Plugin Module
95-190B-003
The 95-190B-003 Plugin Breakout Module is designed to be fitted to a PXI 40-190B Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Connector Test Tools
Yokowo Connector Test Tools - BtoB Clips, Interface Connectors, and Tools for FPC Connectors
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Fanless Embedded System With Socket G2 Intel® Core™ I7/i5/i3 & Celeron® Processor And 4 GbE LANs
eBOX660-872-FL
A high-performance fanless embedded system with 3rd Generation Intel® Core™ processor (Ivy Bridge), the eBOX660-872-FL, is presented by Axiomtek earnestly. It incorporates the 3rd Generation Intel® Core™ processor (i7/ i5/ i3) or Intel® Celeron® processor with Intel® HM76 Express chipset, propelling computing with better processing. With the great graphics computing capability and dual view support, this fanless embedded box computer is especially suited for automatic optical inspection, digital...show more -
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Analogue Concrete Test Hammer
181
The Elcometer 181 Analogue Concrete Test Hammer provides a quick, simple and inexpensive method for non-destructive evaluation of concrete compression strength and other masonry materials.
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ARINC825 (CAN Bus) Test & Simulation Module for PCIe
ACPe825-x
ARINC825 (CAN bus) Test & Simulation module for PCIe with 2 or 4 electrically isolated CAN bus nodes operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s. The ACP825 PCIe card can work either with full functionality as an active CAN node for testing and simulating or in Listening Only mode for monitoring and recording purposes.
